3D7522 Datasheet, PDF (4/4 Pages) Data Delay Devices, Inc. – MONOLITHIC MANCHESTER DECODER

3D7522
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC ± 3^oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
Period:
PW_IN = 1/(2*BAUD)
PER_IN = 1/BAUD
OUTPUT:
R_load:
C_load:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
470Ω
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
W AVEFORM
GENERATOR
OUT
TRIG
IN DEVICE UNDER OUT IN
TEST (DUT)
TRIG
DIGITAL SCOPE
Figure 2: Test Setup
t_RISE
PW_IN
PER_IN
t_FALL
INPUT
2.4V
V_IH
2.4V
SIGNAL
1.5V
0.6V
1.5V
0.6V
V_IL
t_PLH
t_PHL
OUTPUT
SIGNAL
1.5V
V_OH
1.5V
V_OL
Figure 3: Timing Diagram
Doc #06002
DATA DELAY DEVICES, INC.
4
10/31/2007
Tel: [phone] Fax: [phone] http://www.datadelay.com