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CY62126BV Datasheet, PDF (4/9 Pages) Cypress Semiconductor – 64K x 16 Static RAM
CY62126BV
Switching Characteristics[5] Over the Operating Range
62126BV–55
62126BV–70
Parameter
Description
Min. Max. Min. Max. Unit
READ CYCLE
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
tDOE
tLZOE
tHZOE
tLZCE
tHZCE
OE LOW to Data Valid
OE LOW to Low Z[7]
OE HIGH to High Z[6, 7]
CE LOW to Low Z[7]
CE HIGH to High Z[6, 7]
tPU
CE LOW to Power-Up
tPD
CE HIGH to Power-Down
tDBE
Byte Enable to Data Valid
tLZBE
Byte Enable to LOW Z[7]
tHZBE
Byte Disable to HIGH Z[6,7]
WRITE CYCLE[8]
55
70
ns
55
70
ns
10
10
ns
55
70
ns
25
35
ns
5
5
ns
20
25
ns
10
10
ns
20
25
ns
0
0
ns
55
70
ns
25
35
ns
5
5
ns
20
25
ns
tWC
Write Cycle Time
55
70
ns
tSCE
CE LOW to Write End
45
60
ns
tAW
Address Set-Up to Write End
45
60
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-Up to Write Start
0
0
ns
tPWE
WE Pulse Width
40
50
ns
tSD
Data Set-Up to Write End
25
30
ns
tHD
tLZWE
tHZWE
Data Hold from Write End
WE HIGH to Low Z[7]
WE LOW to High Z[6,7]
0
0
ns
5
5
ns
25
25
ns
tBW
Byte Enable to End of Write
45
60
ns
Notes:
5. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
6. tHZOE, tHZCE, tHZWE, and tHZBE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
7. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, tHZWE is less than tLZWE, and tHZBE is less than tLZBE, for any given device.
8. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of these
signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write. Refer to truth table for
further conditions from BHE and BLE.
4