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CY7C1011CV33_06 Datasheet, PDF (3/11 Pages) Cypress Semiconductor – 2-Mbit (128K x 16) Static RAM | |||
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CY7C1011CV33
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. â65°C to +150°C
Ambient Temperature with
Power Applied............................................. â55°C to +125°C
Supply Voltage on VCC to Relative GND[1] .... â0.5V to +4.6V
DC Voltage Applied to Outputs
in High-Z State[1] ....................................â0.5V to VCC + 0.5V
DC Input Voltage[1].................................â0.5V to VCC + 0.5V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage............................................ >2001V
(per MIL-STD-883, Method 3015)
Latch-up Current...................................................... >200 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature
0°C to +70°C
â40°C to +85°C
VCC
3.3V ± 0.3V
DC Electrical Characteristics Over the Operating Range
â10
Parameter
Description
Test Conditions
Min. Max.
VOH
Output HIGH Voltage VCC = Min., IOH = â4.0 mA
VOL
Output LOW Voltage VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[1]
IIX
Input Leakage Current GND < VI < VCC
IOZ
Output Leakage Current GND < VOUT < VCC,
Output Disabled
2.4
0.4
2.0 VCC
+ 0.3
â0.3 0.8
â1 +1
â1 +1
ICC
VCC Operating
VCC = Max.,
Comâl
90
Supply Current
f = fMAX = 1/tRC
Indâl
100
ISB1
Automatic CE
Max. VCC, CE > VIH
40
Power-down Current VIN > VIH or
âTTL Inputs
VIN < VIL, f = fMAX
ISB2
Automatic CE
Max. VCC,
Comâl/
10
Power-down Current CE > VCC â 0.3V,
Indâl
âCMOS Inputs
VIN > VCC â 0.3V,
or VIN < 0.3V, f = 0
Capacitance[2]
â12
Min. Max.
2.4
0.4
2.0 VCC
+ 0.3
â0.3 0.8
â1 +1
â1 +1
85
95
40
10
â15
Min. Max. Unit
2.4
V
0.4 V
2.0 VCC V
+ 0.3
â0.3 0.8 V
â1 +1 µA
â1 +1 µA
80 mA
90 mA
40 mA
10 mA
Parameter
CIN
COUT
Description
Input Capacitance
I/O Capacitance
Test Conditions
TA = 25°C, f = 1 MHz, VCC = 3.3V
Max.
8
8
Unit
pF
pF
Thermal Resistance[2]
Parameter
Description
ÎJA
Thermal Resistance
(Junction to Ambient)
ÎJC
Thermal Resistance
(Junction to Case)
Test Conditions
Still Air, soldered on a 3 Ã 4.5 inch,
four-layer printed circuit board
TSOP II TQFP VFBGA Unit
44.56 42.66 46.98 °C/W
10.75 14.64 9.63 °C/W
Notes:
1. VIL (min.) = â2.0V for pulse durations of less than 20 ns.
2. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05232 Rev. *E
Page 3 of 11
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