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CY7C266_06 Datasheet, PDF (2/12 Pages) Cypress Semiconductor – 8Kx8 Power-Switched and Reprogrammable PROM
CY7C266
Selection Guide
7C266-20
7C266-25
7C266-45
Unit
Maximum Access Time
20
25
45
ns
Maximum Operating Current
Commercial
120
120
100
mA
Maximum Standby Current
Commercial
15
15
15
mA
Maximum Ratings[1]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential
(Pin 28 to Pin 14) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................ –3.0V to +7.0V
DC Program Voltage..................................................... 13.0V
Static Discharge Voltage........................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .................................................... > 200 mA
UV Exposure ................................................ 7258 Wsec/cm2
Operating Range
Range
Commercial
Ambient
Temperature
0°C to +70°C
VCC
5V ± 10%
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
IIX
Input Current
VCD
Input Diode
Clamp Voltage
IOZ
Output Leakage Current
IOS
Output Short
Circuit Current[3]
ICC
Power Supply Current
ISB
Standby Supply Current
Test Conditions
VCC = Min.,
IOH = –2.0 mA
VCC = Min., IOL = 8.0 mA
GND < VIN < VCC
VOL < VOUT < VOH,
Output Disabled
VCC = Max., VOUT = GND
VCC = Max., VIN = 2.0V,
IOUT = 0 mA
Chip Enable Inactive,
CE > VIH, IOUT = 0 mA
Com’l
Com’l
Com’l
Com’l
7C266-20
7C266-25
Unit
Min. Max. Min. Max.
2.4
2.4
V
2.4
0.4
0.4
V
2.0
2.0
V
0.8
0.8
V
–10 +10 –10 +10 µA
Note 3
–40 +40 –40 +40 µA
–20 –90 –20 –90 mA
120
120 mA
15
15 mA
Notes
1. The voltage on any input or I/O pin cannot exceed the power pin during power-up.
2. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
3. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
Document #: 38-04005 Rev. *C
Page 2 of 12
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