CL-L104-MC3W1-F5 Datasheet, PDF (7/12 Pages) CITIZEN ELECTRONICS CO., LTD. – This data sheet is applied to the chip type LED lamp

DATA SHEET
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6. Reliability
(1) Details of the tests
Test Item
Test Condition
Ta=-30 C, I_F=350 mA× 1000 hours(with Al-fin)
Continuous Operation Test Ta=60 C, I_F=350 mA× 1000 hours(with Al-fin)
Ta=85 C, I_F=350 mA× 1000 hours(with Al-fin)
Low Temperature Storage Test -40 C × 1000 hours
High Temperature Storage Test 100 C × 1000 hours
Moisture-proof Test
60 C, 90 %RH for 1000 hours
Thermal Shock Test
-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle
(2) Judgment Criteria of Failure for Reliability Test
(Ta=25 C)
Measuring Item Symbol Measuring Condition Judgment Criteria for Failure
Forward Voltage
V_F
I_F=350mA
> U × 1.1
Total Luminous Flux Φv
I_F=350mA
< S × 0.85
U defines the upper limit of the specified characteristics. S defines the initial value.
Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be
returned to the normal ambient conditions after the completion of each test.
Symbol
CITILED
Name
CL-L104-MC3W1-F5
CITIZEN ELECTRONICS CO.,LTD. JAPAN