NE32584 Datasheet, PDF (1/6 Pages) California Eastern Labs – ULTRA LOW NOISE PSEUDOMORPHIC HJ FET

ULTRA LOW NOISE _NE32584C
PSEUDOMORPHIC HJ FET
FEATURES
• VERY LOW NOISE FIGURE:
0.45 dB Typical at 12 GHz
• HIGH ASSOCIATED GAIN:
12.5 dB Typical at 12 GHz
• LG ≤ 0.20 µm, WG = 200 µm
• LOW COST METAL CERAMIC PACKAGE
• TAPE & REEL PACKAGING OPTION AVAILABLE
DESCRIPTION
The NE32584C is a pseudomorphic Hetero-Junction FET that
uses the junction between Si-doped AlGaAs and undoped
InGaAs to create very high mobility electrons. The device
features mushroom shaped TiAl gates for decreased gate
resistance and improved power handling capabilities. The
mushroom gate also results in lower noise figure and high
associated gain. This device is housed in an epoxy-sealed,
metal/ceramic package and is intended for high volume con-
sumer and industrial applications.
NEC's stringent quality assurance and test procedures assure
the highest reliability and performance.
NOISE FIGURE & ASSOCIATED
GAIN vs. FREQUENCY
VDS = 2 V, IDS = 10 mA
1.2
24
1.0
21
GA
0.8
18
0.6
15
0.4
12
NF
0.2
9
0
6
2
4
6 8 10
20 30
Frequency, f (GHz)
ELECTRICAL CHARACTERISTICS (TA = 25°C)
SYMBOLS
NF¹
GA¹
IDSS
VP
gm
IGSO
RTH (CH-A)
RTH (CH-C)
PART NUMBER
PACKAGE OUTLINE
PARAMETERS AND CONDITIONS
Optimum Noise Figure, VDS = 2 V, IDS = 10 mA, f = 12 GHz
Associated Gain, VDS = 2 V, IDS = 10 mA, f = 12 GHz
Saturated Drain Current, VDS = 2 V,VGS = 0 V
Pinch-off Voltage, VDS = 2 V, IDS = 100 µA
Transconductance, VDS = 2 V, ID = 10 mA
Gate to Source Leakage Current, VGS = -3 V
Thermal Resistance (Channel to Ambient)
Thermal Resistance (Channel to Case)
UNITS
dB
dB
mA
V
mS
µA
°C/W
°C/W
NE32584C
84C
MIN
TYP
0.45
11.0
12.5
20
60
-2.0
-0.7
45
60
0.5
750
MAX
0.55
90
-0.2
10.0
350
Note:
1. Typical values of noise figures and associated gain are those obtained when 50% of the devices from a large number of lots were individually
measured in a circuit with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production line
as a "go-no-go" screening tuned for the "generic" type but not each specimen.
California Eastern Laboratories