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| CAT5401 Datasheet, PDF (7/17 Pages) ON Semiconductor – Quad Digitally Programmable Potentiometers (DPP™) with 64 Taps and SPI Interface | |||
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CAT5401
WRITE CYCLE LIMITS
Over recommended operating conditions unless otherwise stated.
Symbol Parameter
tWR
Write Cycle Time
Min
Typ Max Units
5
ms
RELIABILITY CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol Parameter
Reference Test Method
NEND(1) Endurance
MIL-STD-883, Test Method 1033
TDR(1)
Data Retention
MIL-STD-883, Test Method 1008
VZAP(1) ESD Susceptibility MIL-STD-883, Test Method 3015
ILTH(1)
Latch-Up
JEDEC Standard 17
Min
Typ
1,000,000
100
2000
100
Max Units
Cycles/Byte
Years
Volts
mA
Figure 1. Sychronous Data Timing
VIH
CS
SCK
VIL
tCSS
VIH
VIL
VIH
SI
VIL
tWH
tSU
tH
VALID IN
VOH
SO
VOL
HI-Z
tCS
tCSH
tWL
tRI
tFI
tV
tHO
tDIS
HI-Z
Figure 2. HOLD Timing
CS
SCK
HOLD
tCD
tHD
tCD
tHD
tHZ
HIGH IMPEDANCE
SO
tLZ
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
(3) Dashed Line= mode (1, 1) â â â â
7
Document No. 2010, Rev. F
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