CAT28C010 Datasheet, PDF (3/10 Pages) Catalyst Semiconductor – 1024K-Bit CMOS PARALLEL E2PROM

Advanced Information
CAT28C010
ABSOLUTE MAXIMUM RATINGS*
*COMMENT
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽²⁾ ........... –2.0V to +V_CC + 2.0V
V_CC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽³⁾ ........................ 100 mA
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
RELIABILITY CHARACTERISTICS
Symbol
N_END(1)
T_DR(1)
V_ZAP(1)
I_LTH(1)(4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Min.
10⁴ or 10⁵
100
2000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
D.C. OPERATING CHARACTERISTICS
VCC = 5V ±10%, unless otherwise specified.
Limits
Symbol
I_CC
Parameter
V_CC Current (Operating, TTL)
Min. Typ.
Max.
40
Units
mA
Test Conditions
CE = OE = V_IL, f=6MH_z
All I/O’s Open
I_CCC(5)
V_CC Current (Operating, CMOS)
25
mA CE = OE = V_ILC, f=6MH_z
All I/O’s Open
I_SB
I_SBC(6)
V_CC Current (Standby, TTL)
V_CC Current (Standby, CMOS)
3
mA CE = V_IH, All I/O’s Open
200
µA CE = V_IHC,
All I/O’s Open
I_LI
Input Leakage Current
-10
10
µA V_IN = GND to V_CC
I_LO
Output Leakage Current
-10
10
µA V_OUT = GND to V_CC,
CE = V_IH
V_IH(6)
High Level Input Voltage
2
V_CC +0.3 V
V_IL(5)
Low Level Input Voltage
-1
0.8
V
V_OH
High Level Output Voltage
2.4
V I_OH = –400µA
V_OL
Low Level Output Voltage
0.4
V I_OL = 2.1mA
V_WI
Write Inhibit Voltage
3.5
V
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC +2.0V for periods of less than 20 ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to V_CC +1V.
(5) V_ILC = –0.3V to +0.3V.
(6) V_IHC = V_CC –0.3V to V_CC +0.3V.
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Doc. No. 25093-00 7/99 P-1