CAT34FC02 Datasheet, PDF (2/10 Pages) Catalyst Semiconductor – 2-kb I2C Serial EEPROM, Serial Presence Detect

CAT34FC02
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias
–55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽¹⁾ ............ –2.0 V to VCC + 2.0 V
V_CC with Respect to Ground ............. –2.0 V to +7.0 V
Package Power Dissipation
Capability (TA = 25°C) .................................. 1.0 W
Lead Soldering Temperature (10 seconds) ...... 300°C
Output Short Circuit Current⁽²⁾ ....................... 100 mA
*COMMENT
Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions
outside of those listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for extended periods
may affect device performance and reliability.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
NEND(3)
TDR(3)
V_ZAP(3)(6)
I_LTH(3)(4)
Endurance
Data Retention
ESD Susceptibility
Latch-up
Min.
1,000,000
100
4000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
D.C. OPERATING CHARACTERISTICS
V_CC = 1.7 V to 5.5 V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
ICC
Power Supply Current (Read)
fSCL = 100 kHz
1
mA
ICC
ISB(5)
Power Supply Current (Write)
Standby Current (VCC = 5.0 V)
fSCL = 100 kHz
VIN = GND or VCC
3
mA
1
µA
I_LI
Input Leakage Current
V_IN = GND to V_CC
1
µA
I_LO
Output Leakage Current
V_OUT = GND to V_CC
1
µA
V_IL
Input Low Voltage
–1
V_CC x 0.3
V
V_IH
Input High Voltage
V_CC x 0.7
V_CC + 1.0 V
VOL1 Output Low Voltage (VCC = 3.0 V)
IOL = 3 mA
0.4
V
VOL2 Output Low Voltage (VCC = 1.7 V) IOL = 1.5 mA
0.5
V
CAPACITANCE T_A = 25°C, f = 400 kHz, V_CC = 5 V
Symbol
Test
Conditions
C_I/O(3)
Input/Output Capacitance (SDA)
V_I/O = 0 V
CIN(3)
Input Capacitance (other pins)
VIN = 0 V
Min
Typ
Max Units
8
pF
6
pF
Note:
(1) The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC + 0.5 V, which may overshoot to V_CC + 2.0 V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and
JEDEC test methods.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1.0 V to V_CC + 1.0 V.
(5) Maximum standby current (I_SB) = 10µA for the Extended Automotive temperature range.
(6) Maximum ESD susceptibility for die revision A = 2000 Volts.
Doc. No. 1045, Rev. L
2
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice