SPT7824 Datasheet, PDF (4/11 Pages) Cadeka Microcircuits LLC. – 10-BIT, 40 MSPS, TTL OUTPUT A/D CONVERTER

TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
V
column indicates that the specification is not
tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T_A = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T_A = +25 °C. Parameter is
guaranteed over specified temperature range.
Figure 1A - Timing Diagram
N
t_pwH
CLK
Output
Data
N-2
Figure 1B - Single Event Clock
CLK
Output
Data
N+1
N+2
t_pwL
t_d
N-1
Data Valid
N
Data Valid
N+1
td
Data Valid
Table I - Timing Parameters
PARAMETERS
t_d
t_pwH
DESCRIPTION
MIN
TYP
MAX
CLK to Data Valid Prop Delay
-
14
18
CLK High Pulse Width
10
-
300
t_pwL
CLK Low Pulse Width
10
-
-
UNITS
ns
ns
ns
SPT7824
4
3/11/97