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TLV3011 Datasheet, PDF (1/16 Pages) Burr-Brown (TI) – Nanopower, 1.8V, SOT23 Comparator with Voltage Reference
TLV3011
TLV3012
SBOS300B – FEBRUARY 2004 – REVISED JUNE 2004
Nanopower, 1.8V, SOT23
Comparator with Voltage Reference
FEATURES
q LOW QUIESCENT CURRENT: 5µA (max)
q INTEGRATED VOLTAGE REFERENCE: 1.242V
q INPUT COMMON-MODE RANGE:
200mV Beyond Rails
q VOLTAGE REFERENCE INITIAL ACCURACY: 1%
q OPEN-DRAIN LOGIC COMPATIBLE OUTPUT:
TLV3011
q PUSH-PULL OUTPUT: TLV3012
q LOW-SUPPLY VOLTAGE: 1.8V to 5.5V
q FAST RESPONSE TIME: 6µs Propagation Delay
with 100mV Overdrive (TLV3011: RPULL-UP = 10kΩ)
q MicroSIZE PACKAGES: SOT23-6 and SC70-6
APPLICATIONS
q BATTERY-POWERED LEVEL DETECTION
q DATA ACQUISITION
q SYSTEM MONITORING
q OSCILLATORS
q SENSOR SYSTEMS:
Smoke Detectors, Light Sensors, Alarms
DESCRIPTION
The TLV3011 is a low-power, open-drain output comparator;
the TLV3012 is a push-pull output comparator. Both feature
an uncommitted on-chip voltage reference. Both have 5µA
(max) quiescent current, input common-mode range 200mV
beyond the supply rails, and single-supply operation from
1.8V to 5.5V. The integrated 1.242V series voltage reference
offers low 100ppm/°C (max) drift, is stable with up to 10nF
capacitive load, and can provide up to 0.5mA (typ) of output
current.
The TLV3011 and TLV3012 are available in the tiny SOT23-6
package for space-conservative designs. It is also available in
the SC70 package for even greater board area savings. Both
versions are specified for the temperature range of –40°C to
+125°C.
TLV3011 and TLV3012 RELATED PRODUCTS
PRODUCT
TLV349x
TLV370x
TLV340x
FEATURES
1.2µA, 1.8V to 5.5V Push-Pull Comparator
560nA, 2.5V to 16V Push-Pull CMOS Output Comparator
550nA, 2.5V to 16V Open-Drain Comparator
OUT 1
V− 2
IN+ 3
6 V+
5 REF
4 IN−
TLV3011
TLV3012
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 2004, Texas Instruments Incorporated