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INA270_07 Datasheet, PDF (1/17 Pages) Burr-Brown (TI) – Voltage Output, Unidirectional Measurement Current-Shunt Monitor
BurrĆBrown Products
from Texas Instruments
INA270
INA271
INA270
INA271
SBOS381A – FEBRUARY 2007 – REVISED APRIL 2007
Voltage Output, Unidirectional Measurement
Current-Shunt Monitor
FEATURES
• WIDE COMMON-MODE RANGE: –16V to +80V
• CMRR: 120dB
• ACCURACY:
±2.5mV offset (max)
±1% gain error (max)
20µV/°C offset drift (max)
55ppm/°C gain drift (max)
• BANDWIDTH: Up to 130kHz
• TWO TRANSFER FUNCTIONS AVAILABLE:
14V/V (INA270)
20V/V (INA271)
• QUIESCENT CURRENT: 900µA (max)
• POWER SUPPLY: +2.7V to +18V
• PROVISION FOR FILTERING
APPLICATIONS
• POWER MANAGEMENT
• AUTOMOTIVE
• TELECOM EQUIPMENT
• NOTEBOOK COMPUTERS
• BATTERY CHARGERS
• CELL PHONES
• WELDING EQUIPMENT
DESCRIPTION
The INA270 and INA271 family of current-shunt
monitors with voltage output can sense drops across
current shunts at common-mode voltages from –16V
to +80V, independent of the supply voltage. The
INA270 and INA271 pinouts readily enable filtering.
The INA270 and INA271 are available with two
output voltage scales: 14V/V and 20V/V. The 130kHz
bandwidth simplifies use in current-control loops.
The INA270 and INA271 operate from a single +2.7V
to +18V supply, drawing a maximum of 900µA of
supply current. They are specified over the extended
operating temperature range of –40°C to +125°C and
are offered in an SO-8 package.
RS
-16V to +80V
Supply
Load
Single-Pole Filter
Capacitor
+2.7V to +18V
IN+
IN-
PRE OUT BUF IN
V+
5kW
5kW
A1
OUT
96kW
A2
RL
INA270
GND
DEVICE COMPARISON
DEVICE
INA270
INA271
GAIN
14V/V
20V/V
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated