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INA200_07 Datasheet, PDF (1/22 Pages) Burr-Brown (TI) – High-Side Measurement Current-Shunt Monitor with Comparator and Reference
INA200
IN A 20 0
INA201
INA202
SBOS374 − NOVEMBER 2006
High-Side Measurement Current-Shunt Monitor
with Comparator and Reference
FEATURES
D COMPLETE CURRENT SENSE SOLUTION
D 0.6V INTERNAL VOLTAGE REFERENCE
D INTERNAL OPEN-DRAIN COMPARATOR
D LATCHING CAPABILITY ON COMPARATOR
D COMMON-MODE RANGE: −16V to +80V
D HIGH ACCURACY: 3.5% MAX ERROR OVER
TEMPERATURE
D BANDWIDTH: 500kHz (INA200)
D QUIESCENT CURRENT: 1800µA (max)
D PACKAGES: SO-8, MSOP-8
APPLICATIONS
D NOTEBOOK COMPUTERS
D CELL PHONES
D TELECOM EQUIPMENT
D AUTOMOTIVE
D POWER MANAGEMENT
D BATTERY CHARGERS
D WELDING EQUIPMENT
DESCRIPTION
The INA200, INA201, and INA202 are high-side
current-shunt monitors with voltage output. The
INA200−INA202 can sense drops across shunts at
common-mode voltages from −16V to 80V. The
INA200−INA202 are available with three output voltage
scales: 20V/V, 50V/V, and 100V/V, with up to 500kHz
bandwidth.
The INA200, INA201, and INA202 also incorporate an
open-drain comparator and internal reference providing a
0.6V threshold. External dividers are used to set the
current trip point. The comparator includes a latching
capability, which can be made transparent by grounding
(or leaving open) the RESET pin.
The INA200, INA201, and INA202 operate from a single
+2.7V to +18V supply, drawing a maximum of 1800µA of
supply current. Package options include the very small
MSOP-8 and the SO-8. All versions are specified over the
extended operating temperature range of −40°C to
+125°C.
1
V+
INA200 (G = 20)
INA201 (G = 50)
INA202 (G = 100)
2 OUT
G
0.6V
Reference
3 CMPIN
VIN+ 8
VIN− 7
CMPOUT 6
Comparator
4 GND
RESET 5
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semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright  2006, Texas Instruments Incorporated
www.ti.com