ADS8411 Datasheet, PDF (1/23 Pages) Burr-Brown (TI) – 16-BIT, 2 MSPS, UNIPOLAR INPUT, MICRO POWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE

BurrĆBrown Products
from Texas Instruments
ADS8411
SLAS369B – APRIL 2002 – REVISED DECEMBER 2004
16-BIT, 2 MSPS, UNIPOLAR INPUT, MICRO POWER SAMPLING
ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
FEATURES
• 2-MHz Sample Rate
• 16-Bit NMC Ensured Over Temperature
• Zero Latency
• Unipolar Single-Ended Input Range:
0 V to V_ref
• Onboard Reference
• Onboard Reference Buffer
• High-Speed Parallel Interface
• Power Dissipation: 175 mW at 2 MHz Typ
• Wide Digital Supply
• 8-/16-Bit Bus Transfer
• 48-Pin TQFP Package
• ESD Sensitive – HBM Capability of 500 V,
1000 V at All Input Pins
APPLICATIONS
• DWDM
• Instrumentation
• High-Speed, High-Resolution, Zero Latency
Data Acquisition Systems
• Transducer Interface
• Medical Instruments
• Communication
DESCRIPTION
The ADS8411 is a 16-bit, 2 MHz A/D converter with
an internal 4.096-V reference. The device includes a
16-bit capacitor-based SAR A/D converter with in-
herent sample and hold. The ADS8411 offers a full
16-bit interface and an 8-bit option where data is read
using two 8-bit read cycles.
The ADS8411 has a unipolar single-ended input. It is
available in a 48-lead TQFP package and is
characterized over the industrial -40°C to 85°C tem-
perature range.
REFOUT
SAR
+IN +
_
−IN
REFIN
CDAC
Comparator
4.096-V
Internal
Reference
Clock
Output
Latches
and
3-State
Drivers
Conversion
and
Control Logic
BYTE
16-/8-Bit
Parallel DATA
Output Bus
RESET
CONVST
BUSY
CS
RD
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2004, Texas Instruments Incorporated