ADS8343 Datasheet, PDF (1/18 Pages) Burr-Brown (TI) – 16-Bit, 4-Channel Serial Output Sampling ANALOG-TO-DIGITAL CONVERTER

ADS8343
ADS8343
SBAS183A – JANUARY 2001 – REVISED OCTOBER 2002
16-Bit, 4-Channel Serial Output Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
q BIPOLAR INPUT RANGE
q PIN-FOR-PIN COMPATIBLE WITH THE
ADS7841 AND ADS8341
q SINGLE SUPPLY: 2.7V to 5V
q 4-CHANNEL SINGLE-ENDED OR
2-CHANNEL DIFFERENTIAL INPUT
q UP TO 100kHz CONVERSION RATE
q 86dB SINAD
q SERIAL INTERFACE
q SSOP-16 PACKAGE
APPLICATIONS
q DATA ACQUISITION
q TEST AND MEASUREMENT
q INDUSTRIAL PROCESS CONTROL
q PERSONAL DIGITAL ASSISTANTS
q BATTERY-POWERED SYSTEMS
DESCRIPTION
The ADS8343 is a 4-channel, 16-bit sampling Analog-to-
Digital (A/D) converter with a synchronous serial interface.
Typical power dissipation is 8mW at a 100kHz throughput
rate and a +5V supply. The reference voltage (V_REF) can be
varied between 500mV and V_CC/2, providing a corresponding
input voltage range of ±V_REF. The device includes a shut-
down mode which reduces power dissipation to under 15µW.
The ADS8343 is ensured down to 2.7V operation.
Low power, high speed, and an onboard multiplexer make
the ADS8343 ideal for battery-operated systems such as
personal digital assistants, portable multi-channel data log-
gers, and measurement equipment. The serial interface also
provides low-cost isolation for remote data acquisition. The
ADS8343 is available in an SSOP-16 package and is en-
sured over the –40°C to +85°C temperature range.
CH0
CH1
CH2
CH3
COM
V_REF
Four
Channel
Multiplexer
SAR
CDAC
Comparator
Serial
Interface
and
Control
DCLK
CS
SHDN
DIN
DOUT
BUSY
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 2001, Texas Instruments Incorporated