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| BL-HG036D-TRB Datasheet, PDF (5/7 Pages) BRIGHT LED ELECTRONICS CORP – Yellow Green Suitable for all SMT assembly methods. | |||
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BRIGHT LED ELECTRONICS CORP.
SINCE 1981
BL-HG036D-TRB
â Reliability Test
Classification Test Item
Operation Life
Endurance
Test
High
Temperature
High Humidity
Storage
High
Temperature
Storage
Low
Temperature
Storage
Temperature
Cycling
Thermal Shock
Solder
Resistance
Environmental IR-Reflow
Test
Solderability
Solderability
Reference Standard
MIL-STD-750:1026
MIL-STD-883:1005
JIS-C-7021 :B-1
MIL-STD-202:103B
JIS-C-7021 :B-11
MIL-STD-883:1008
JIS-C-7021 :B-10
JIS-C-7021 :B-12
MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1010
JIS-C-7021 :A-4
MIL-STD-202:107D
MIL-STD-750:1051
MIL-STD-883:1011
MIL-STD-202:201A
MIL-STD-750:2031
JIS-C-7021 :A-1
-
-
-
Test Conditions
Ta=Under RoomTemperature As Per Data
Sheet Maximum Rating
Test Time=1000HRS(-24HRS,+72HRS)ï¼
20mA
Ta=+65â±5â
RH=90%-95%
Test time=240hrs±2HRS
Result
0/20
0/20
High Ta=+105â±5â
Test time=1,000hrs(-24HRS,+72HRS)
0/20
Low Ta=-55â±5â
Test time=1,000hrs(-24HRS,+72HRS)
0/20
+105â ~ +25â ~ -55â ~ +25â
30min 5min 30min 5min
Test Time=10cycle
0/20
IR-Reflow In-Board, 2
(10min)~-40±5â(10min)
Test Time=10cycle
T.sol=260±5â
Dwell Time=10±1secs
Times
85±5 â
0/20
0/20
Ramp-up rate(183â to Peak)+3â 1sec
max
0/20
Temp maintain at125±25â 120sec max
0/20
Temp maintain above 183â 60ï½150sec
0/20
Peak temperature range 235âï½240â
0/20
Time within5â of actual Pwck
Temperature10-30sec
0/20
Ramp-down rate+6â 1sec max
0/20
T.sol=235±5â
0/20
Immesion time 2±0.5sec
0/20
Immesion rate 25±2.5mm/sec
0/20
Coverageâ§95% of the dipped surface
0/20
â Judgment criteria of failure for the reliability
Measuring items
Forward voltage
Reverse current
Luminous intensity
Symbol
VF ( V)
IR(uA)
Iv ( mcd )
Measuring conditions
IF=20mA
VR=5V
IF=20mA
Judgement criteria for failure
Over Ux1.2
Over Ux2
Below SX0.5
Note: 1.U means the upper limit of specified characteristics. S means initial value.
2.Measurment shall be taken between 2 hours and after the test pieces have been returned to
normal ambient conditions after completion of each test.
Ver.2.0 Page 5 of 7
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