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C650-180-WH_15 Datasheet, PDF (4/6 Pages) Bourns Electronic Solutions – TBU High-Speed Protectors | |||
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C650 and C850 Series TBU® High-Speed Protectors
Product Dimensions
B
A
XXXXX
C
YWWLL
H
J
D
3
J
H
E
D
K
21
F
PIN 1
TOP VIEW
Recommended Pad Layout
0.70
(.028)
2.625
(.103)
1.15
(.045)
3.55
(.140)
A1
SEATING PLANE
K
SIDE VIEW
BOTTOM VIEW
Pad Designation
Pad #
Apply
1
In/Out
2
NC
3
In/Out
NC = Solder to PCB; do not make electrical
connection, do not connect to ground.
Dim.
A
A1
B
C
D
E
F
H
J
K
Min.
0.80
(.031)
0.00
(.000)
8.15
(.321)
3.90
(.154)
2.55
(.100)
1.10
(.043)
3.45
(.136)
0.20
(.008)
0.65
(.026)
0.20
(.008)
Typ.
0.90
(.035)
0.025
(.001)
8.25
(.325)
4.00
(.157)
2.60
(.102)
1.15
(.045)
3.50
(.138)
0.25
(.010)
0.70
(.028)
0.25
(.010)
Max.
1.00
(.039)
0.050
(.002)
8.35
(.329)
4.10
(.161)
2.65
(.104)
1.20
(.047)
3.55
(.140)
0.30
(.012)
0.75
(.030)
0.30
(.012)
DIMENSIONS:
MM
(INCHES)
TBU® protectors have matte-tin termination ï¬nish. Suggested layout should use non-solder mask deï¬ne (NSMD). Recommended stencil thick-
ness is 0.10-0.12 mm (.004-.005 in.) with stencil opening size 0.025 mm (.0010 in.) less than the device pad size. As when heat sinking any
power device, it is recommended that, wherever possible, extra PCB copper area is allowed. For minimum parasitic capacitance, do not allow
any signal, ground or power signals beneath any of the pads of the device.
Thermal Resistances
Symbol
Rth(j-a)
Parameter
Junction to leads (package)
Value
116
Unit
°C/W
Reï¬ow Proï¬le
Proï¬le Feature
Average Ramp-Up Rate (Tsmax to Tp)
Preheat
- Temperature Min. (Tsmin)
- Temperature Max. (Tsmax)
- Time (tsmin to tsmax)
Time maintained above:
- Temperature (TL)
- Time (tL)
Peak/Classiï¬cation Temperature (Tp)
Time within 5 °C of Actual Peak Temp. (tp)
Ramp-Down Rate
Time 25 °C to Peak Temperature
Pb-Free Assembly
3 °C/sec. max.
150 °C
200 °C
60-180 sec.
217 °C
60-150 sec.
260 °C
20-40 sec.
6 °C/sec. max.
8 min. max.
Speciï¬cations are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their speciï¬c applications.
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