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PTVS3-058C Datasheet, PDF (1/4 Pages) Bourns Electronic Solutions – PTVS3-xxxC Series High Current TVS Diodes
*RoHS COMPLIANT
Features
■ 3 kA, 8/20 µs surge capability
■ Low clamping voltage under surge
■ Bidirectional TVS
■ UL Recognized
Applications
■ AC line protection
■ High power DC bus protection
PTVS3-xxxC Series High Current TVS Diodes
General Information
The PTVS3-xxxC range of high current bidirectional TVS diodes is
designed for use in AC line protection and high power DC bus
clamping applications. These devices offer bidirectional port protection
from 58 volts to 430 volts.
The devices are RoHS* and UL compliant while also meeting IEC
61000-4-5 8/20 µs current surge requirements.
Agency Approval
Description
UL File Number: E313168
Absolute Maximum Ratings (@ TA = 25 °C Unless Otherwise Noted)
Rating
Repetitive Standoff Voltage
Peak Current Rating per 8/20 µs IEC 61000-4-5
Operating Junction Temperature Range
Storage Temperature Range
Lead Temperature, Soldering (10 s)
Symbol
Value
Unit
PTVS3-058C
58
PTVS3-066C
66
PTVS3-076C
VWM
76
V
PTVS3-380C
380
PTVS3-430C
430
IPPM
3
kA
TJ
-55 to +150
°C
TS
-55 to +150
°C
260
°C
Electrical Characteristics (@ TA = 25 °C Unless Otherwise Noted)
Parameter
ID Standby Current
V(BR) Breakdown Voltage
VC Clamping Voltage
V(BR) Temperature Coefficient
C Capacitance
Test Conditions
VD = VWM
IBR = 10 mA
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
IPP = 3 kA
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
F = 10 kHz,
Vd = 1 Vrms
PTVS3-058C
PTVS3-066C
PTVS3-076C
PTVS3-380C
PTVS3-430C
Min.
64
72
85
401
440
Typ.
66
77
92
420
470
85
100
110
510
560
0.1
2.0
1.7
1.5
0.7
0.6
Max.
10
70
82
95
443
490
100
120
130
570
620
2.3
2.2
2.0
1.2
1.0
Unit
µA
V
V
%/°C
nF
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.