PTVS3-015C-TH Datasheet, PDF (1/3 Pages) Bourns Electronic Solutions – High Current TVS Diode

*RoHS ^COMPLIANT
Features
■ 3 kA, 8/20 µs surge capability
■ Low clamping voltage under surge
■ Bidirectional TVS
■ Excellent performance over temperature
Applications
■ High power DC bus protection
Model PTVS3-015C-TH High Current TVS Diode
General Information
The Model PTVS3-015C-TH high current bidirectional TVS diode is designed for use
in high power DC bus clamping applications. This device offers bidirectional port
protection.
The device is RoHS* compliant and halogen free**. It also meets IEC 61000-4-5
8/20 μs current surge requirements.
Absolute Maximum Ratings (@ T_A = 25 °C Unless Otherwise Noted)
Rating
Repetitive Standoff Voltage
Peak Current Rating per 8/20 μs IEC 61000-4-5
Operating Junction Temperature Range
Storage Temperature Range
Lead Temperature, Soldering (10 s)
Symbol
Value
Unit
V_WM
15
V
I_PPM
3
kA
T_J
-40 to +125
°C
T_S
-55 to +150
°C
260
°C
Electrical Characteristics (@ T_A = 25 °C Unless Otherwise Noted)
Parameter
Test Conditions
I_D Standby Current
V_(BR) Breakdown Voltage
V_C Clamping Voltage ⁽¹⁾ per IEC61000-4-5
(8/20 μs current waveform)
V_D = V_WM
I_BR = 10 mA
I_PP = 3 kA
V_(BR) Temperature Coefficient
C Capacitance
F = 10 kHz,
V_d = 1 Vrms
(1) _{VC measured at the time which is coincident with the peak surge current.}
Min.
16
Typ.
17.5
28
0.1
7.5
Max.
10
19
Unit
μA
V
V
%/°C
nF
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EMEA: Tel: [phone] • Fax: [phone]
The Americas: Tel: [phone] • Fax: [phone]
www.bourns.com
* RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
**Bourns considers a product to be “halogen free” if (a) the Bromine (Br) content is 900 ppm or less; (b) the Chlorine (Cl) content is 900 ppm or less; and (c) the total Bromine (Br)
and Chlorine (Cl) content is 1500 ppm or less.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.