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PTVS10-380C-TH Datasheet, PDF (1/3 Pages) Bourns Electronic Solutions – High Voltage, High Current TVS Diodes
*RoHS COMPLIANT
Features
■ 10 kA, 8/20 µs surge capability
■ Low clamping voltage under surge
■ Bidirectional TVS
■ Excellent performance over temperature
Applications
■ AC line protection
■ High power DC bus protection
PTVS10-xxxC-TH Series High Voltage, High Current TVS Diodes
General Information
The Model PTVS10-xxxC-TH high voltage, high current, bidirectional TVS diode series
is designed for use in AC line and high power DC bus clamping applications.
The devices are RoHS* compliant. They also meet IEC 61000-4-5 8/20 μs current
surge requirements.
Absolute Maximum Ratings (@ TA = 25 °C Unless Otherwise Noted)
Rating
Repetitive Standoff Voltage
Peak Current Rating per 8/20 μs IEC 61000-4-5
Operating Junction Temperature Range
Storage Temperature Range
Lead Temperature, Soldering (10 s)
Symbol
Value
Unit
PTVS10-170C-TH
170
PTVS10-320C-TH
320
PTVS10-380C-TH
VWM
380
V
PTVS10-430C-TH
430
PTVS10-470C-TH
470
IPPM
10
kA
TJ
-55 to +125
°C
TS
-55 to +150
°C
260
°C
Electrical Characteristics (@ TA = 25 °C Unless Otherwise Noted)
Parameter
Test Conditions
ID Standby Current
V(BR) Breakdown Voltage
VD = VWM
IBR = 10 mA
PTVS10-170C-TH
PTVS10-320C-TH
PTVS10-380C-TH
PTVS10-430C-TH
PTVS10-470C-TH
VC Clamping Voltage (1)
IPP = 10 kA
PTVS10-170C-TH
PTVS10-320C-TH
PTVS10-380C-TH
PTVS10-430C-TH
PTVS10-470C-TH
V(BR) Temperature Coefficient
C Capacitance
F = 10 kHz,
Vd = 1 Vrms
PTVS10-170C-TH
PTVS10-320C-TH
PTVS10-380C-TH
PTVS10-430C-TH
PTVS10-470C-TH
(1) VC measured at the time which is coincident with the peak surge current.
Min.
190
336
401
440
470
Typ.
200
352
422
465
500
260
440
520
580
630
0.1
2.5
1.4
1.2
1.1
1.0
Max.
Unit
10
μA
210
368
442
V
490
530
V
%/°C
nF
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.