CRH1206-FW-1024ELF Datasheet, PDF (1/3 Pages) Bourns Electronic Solutions – CRH0603/CRH0805/CRH1206 - Chip Resistors

*RoHS ^COMPLIANT
Features
■ 1 % tolerance from 1.02 megohms to
10 megohms
■ RoHS compliant*
■ Power rating at 70 °C: CRH0603 - 0.10 W,
CRH0805 - 0.125 W, CRH1206 - 0.25 W
■ Suitable for all types of soldering
processes
■ Three layer contacting process with
nickel barrier helps prevent leaching and
provides excellent solderability
■ Paper tape on reel for automatic
placement
CRH0603/CRH0805/CRH1206 - Chip Resistors
Electrical Characteristics
Characteristic
Power Rating @ 70 °C
Operating Temperature Range
Derated to 0 Load at
Maximum Working Voltage
Maximum Overload Voltage
Resistance Range (E-96 + E-24)
Temperature Coefficient
Model
CRH0603
Model
CRH0805
Model
CRH1206
1/10 W
1/8 W
1/4 W
-55 °C to +125 °C
+125 °C
50 V
100 V
200 V
100 V
200 V
400 V
1.02 megohms - 10 megohms
±200 ppm/°C
For Standard Values Used in Capacitors, Inductors, and Resistors, click here.
Chip Dimensions
Dimension
L
W
H
I1
I2
Model
CRH0603
1.60±0.10
(0.063±0.004)
0.80±0.10
(0.031±0.004)
0.45±0.10
(0.018±0.004)
0.30±0.20
(0.012±0.008)
0.30±0.20
(0.012±0.008)
Derating Curve
Model
CRH0805
2.00±0.15
(0.079±0.006)
1.25±0.15
(0.049±0.006)
0.50±0.10
(0.020±0.004)
0.40±0.20
(0.016±0.008)
0.40±0.20
(0.016±0.008)
Model
CRH1206
3.20±0.25
(0.126±0.010)
1.60±0.15
(0.063±0.006)
0.60±0.15
(0.024±0.006)
0.50±0.25
(0.020±0.010)
0.50±0.20
(0.020±0.010)
DIMENSIONS ARE:
MM
(INCHES)
Characteristic Data
Tests per IEC115-1
Load Life (1000 hours)
Load Life Humidity
(1000 hours)
Short Time Overload
Dimensional Drawing
I1
H
∆R Max.
±1 %
±1 %
±1 %
I1
I2
I2
L
Resistor (Ru02)
(Jumper chip is
a conductor)
W
Overcoat
Alumina Substrate
Internal Electrode (Ag-Pd)
Secondary Electrode (Nickel Plated)
External Electrode
(see Part Numbering - may be
ordered as solder-plated
or tin-plated)
100
80
60
40
20
0
-55
0
70
125
(°C) Ambient temperature
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*RoHS Directive 2002/95/EC Jan 27 2003 including Annex
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.