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CR0603-121ELF Datasheet, PDF (1/5 Pages) Bourns Electronic Solutions – CR0603/CR0805/CR1206 - Chip Resistors
*RoHS COMPLIANT
Features
■ RoHS compliant*
■ Power rating at 70 °C: CR0603 - 0.10 W,
CR0805 - 0.125 W, CR1206 - 0.25 W
■ Tight tolerances of bottom electrode
width
■ Suitable for all types of soldering processes
■ Three layer contacting process with
nickel barrier prevents leaching and
provides excellent solderability
■ Paper tape on reel for automatic
placement
CR0603/CR0805/CR1206 - Chip Resistors
Electrical Characteristics
Characteristic
Power Rating @ 70 °C
Operating Temperature Range
Derated to 0 Load at
Maximum Working Voltage
Maximum Overload Voltage
Resistance Range: 1 %
E-96 + E-24
Model
CR0603
1/10 W
50 V
100 V
Resistance Range: 5 %
E-24
Zero Ohm Jumper <0.05 ohm
Rated / Maximum Current
1 A / 2.5 A
For Standard Values Used in Capacitors, Inductors, and Resistors, click here.
Model
CR0805
1/8 W
-55 °C to +155 °C
+155 °C
150 V
300 V
10 ohms ≤ R ≤ 1M ohms
±100 PPM/°C
1M ohms < R ≤ 10M ohms
±200 PPM/°C
10 ohms ≤ R ≤ 10M ohms
±200 PPM/°C
1 ohm ≤ R < 10 ohms
10M ohms < R ≤ 20M ohms
±400 PPM/°C
2A/5A
Model
CR1206
1/4 W
200 V
400 V
2A/5A
Chip Dimensions
Dimension
L
W
H
I1
I2
Model
CR0603
1.60±0.10
(0.063±0.004)
0.80±0.10
(0.031±0.004)
0.45±0.10
(0.018±0.004)
0.30±0.20
(0.012±0.008)
0.30±0.20
(0.012±0.008)
Derating Curve
Model
CR0805
2.00±0.15
(0.079±0.006)
1.25±0.15
(0.049±0.006)
0.50±0.10
(0.020±0.004)
0.40±0.20
(0.016±0.008)
0.40±0.20
(0.016±0.008)
Model
CR1206
3.20±0.25
(0.126±0.010)
1.60±0.15
(0.063±0.006)
0.60±0.15
(0.024±0.006)
0.50±0.25
(0.020±0.010)
0.50±0.20
(0.020±0.010)
DIMENSIONS:
MM
(INCHES)
Characteristic Data
I1
I1
H
I2
I2
W
L
100
80
60
40
20
0
-55
0
155
Ambient Temperature (°C)
*RoHS Directive 2002/95/EC Jan. 27, 2003 including
annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data
sheet can and do vary in different applications and
actual device performance may vary over time.
Users should verify actual device performance in their
specific applications.