CDNBS08-T58CC Datasheet, PDF (1/4 Pages) Bourns Electronic Solutions – Protects four lines

*RoHS ^COMPLIANT
Features
■ Protects four lines
■ Unidirectional
■ 24 A peak surge current
■ RoHS compliant*
Applications
■ PoE power protection
■ DC power supply protection
CDNBS08-T58CC - Common Cathode TVS Diode
General Information
The Model CDNBS08-T58CC is designed to protect the power section in Power over
Ethernet (PoE) applications. The device is packaged in an eight lead narrow body
SOIC package. Bourns^® Chip Diodes are available in surface mount packages and are
easy to handle using standard pick and place equipment.
In addition to surge protection, the device provides Level 4 ESD protection per
IEC 61000-4-2.
8
7
6
5
1
2
3
4
Maximum Ratings (@ T_A = 25 °C Unless Otherwise Noted)
Parameter
Symbol
Value
Unit
Peak Pulse Current (8/20 µs)
I_PP
24
A
Peak Pulse Power (8/20 µs)
P_PP
2700
W
Working Peak Reverse Voltage
V_WM
58
V
IEC 61000-4-2 Contact Discharge
ESD
30
kV
Junction Temperature
T_J
-55 to +150
°C
Storage Temperature
T_STG
-65 to +150
°C
Electrical Characteristics (@ T_A = 25 °C Unless Otherwise Noted)
Parameter
Breakdown Voltage @ 1 mA
V_BR Temperature Coefficient
Leakage Current
Capacitance
Clamping Voltage
Forward Voltage
Symbol
V_BR
V_BR
I_R
C
V_C
V_F
Test Condition
I_BR = 1 mA
I_BR = 1 mA
V_R = V_WM
T_A = 25 °C
T_A = 85 °C
V_R = -44 V, f = 1 MHz, 30 mV rms
I_PP = 24 A (8/20 µs)
I_F = 1 A, T_W = 100 µs
Min. Typ. Max. Unit
64.4
68
71.2
V
0.1
%/°C
200
nA
1
µA
55
pF
100
V
1
V
Device Pinout
Pin
Function
1
ANODE 1
2
GND
3
GND
4
ANODE 2
5
ANODE 3
6
GND
7
GND
8
ANODE 4
Asia-Pacific: Tel: [phone] • Fax: [phone]
EMEA: Tel: [phone] • Fax: [phone]
The Americas: Tel: [phone] • Fax: [phone]
www.bourns.com
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.