EML10ZCA Datasheet, PDF (7/8 Pages) Bookham, Inc. – 10Gb/s EA Modulator and DFB Laser with GPO RF Connector

Data Sheet
Reliability
Bookham has a corporate policy for continuous improvement, to provide optical components with superior quality in terms of
opto-electronic performance and operational life and reliability. The Bookham EML10 and EML11 Integrated Electro-absorption
laser products use a ridge waveguide structure for the laser and modulator, which provides superior reliability compared to buried
heterostructures. It has been subjected to a stringent reliability assurance program, the conclusions of which confirm product
reliability exceed the generic requirements of Telcordia GR-468 CORE.
More than 965,000 device-hours of data under accelerated life test conditions have been analysed, which for the purpose of
characterising random failure rate, is equivalent to 28,300,000 device hours at 25ºC operating temperature [7]. Electro-optic
parameters for a 15 year service life at operating temperature of 25ºC have been estimated. The estimated delta over life for
specific device parameters is shown in the table below.
Parameter
EA - Extinction rate ER
Laser threshold current
Laser efficiency
Laser current for constant output power
Laser power at constant current (100 mA)
Maximum allowed change
0.5 dB
10 %
10 %
10 %
10 %
Change over 15 years @ 25 °C
Mean (std. deviation)
-0.03 dB (0.2 dB)
0.01 % (0.3 %)
-0.2 % (0.4 %)
0.2 % (0.4 %)
-0.2 % (0.4 %)
The reliability failure rate statistics are summarized in the table below. The results are reported for the operation of the device
against a laser bias of 100 mA drive current. The resultant low MTTF [8], essentially demonstrating minimal component wear out
over the rated 15-year lifetime of the component [7].
Parameter
Value
Median life (ML) at 25°C
σ (standard deviation of the natural logarithms of the TTFs)
µ (mean of the natural logarithms of the TTFs)
Maximum wear-out failure rate
Average wear-out failure rate over 15 years life
Wear-out thermal activation energy
Random failure rate at 25°C at 60% confidence
Random failure rate activation energy
528⁽¹⁾
0.64
6.27
0
0
0.5
33
0.35
Notes:
[7] Refer to QR1524, qualification report for the Bookham 10Gb/s Electro-Absorption Modulated Laser.
[8] Bookham Technology’s policy is to derive random failure rates from actual field data.
Units
Years
FITs
FITs
eV
FITs
eV
7