AZT71_1301 Datasheet, PDF (10/14 Pages) Arizona Microtek, Inc – Programmable Capacitive Tuning IC

Arizona Microtek, Inc.
AZT71
Programmable Capacitive Tuning IC
PERFORMANCE DATA
Table 8 – Absolute Maximum Ratings
Absolute Maximum Ratings are those values beyond which device life may be impaired.
Symbol
Characteristic
Rating
Unit
V_DD
V_I1
T_A
T_STG
ESD_HBM
ESD_MM
Power Supply
Input Voltage
Operating Temperature Range
Storage Temperature Range
Human Body Model
Machine Model
0 to +6.5
V
-0.5 to V_DD + 0.5
V
-40 to +85
°C
-65 to +150
°C
TBD
V
TBD
V
ESD_CDM
Charged Device Model
TBD
V
1 _{PV Pin can exceed VDD by 1.2V during the programming interval}
Table 9 – DC Characteristics
DC Characteristics (V_DD = 2.375V to 3.6V unless otherwise specified, T_A = -40 to 85 °C)
Symbol
Characteristic
Conditions
Min
C_PV
Nominal capacitance variation across
process
-15
Typ Max _Unit
+15 %
C_VV
Capacitance variation across output
voltage
Voltage variation at X₁ pin, 100MHz
±150 ppm/V
C_TV
Capacitance variation across
temperature
100MHz - Zero Code
100MHz - Mid Code¹
100MHz - Full Scale
325
40
ppm/°C
130
V_IH
Input HIGH Voltage
DA, CLK
0.8 * V_DD
V
V_IL
Input LOW Voltage
DA, CLK
0.2 * V_DD
V
R_PD,D
Pull-down Resistor
DA
75k
Ω
R_PD,CLK
Pull-down Resistor
CLK
75k
Ω
R_PD,PV
Pull-down Resistor
PV
170k
Ω
V_OH
Output High Voltage
PV Pin when reading EEPROM bits
V_OL
Output Low Voltage
68kΩ external pull-up resistor to V_DD
0.6 * V_DD
V
0.4
V
V_PP
Programming Voltage (V_DD=5.0V) PV pin when programming EEPROM
5.6
I_DD
I_DDPROG
t_MEM
T_prog
Cy_prog
Power Supply Current
Power Supply Current
EEPROM Data Retention
Programming Temperature
Programming Cycle
1 _{Bit4, Bit7 High}
Normal Operation
Programming Mode
10
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6.0
6.1 V
7.0
50 µA
20 µA
20
yrs
25
°C
k
Jan 2013, Rev 1.3