AXX3225L Datasheet, PDF (2/2 Pages) Advanced XTAL Products – Quartz Crystal Unit in SMD package 3.2x2.5 mm Low frequency version operating in “Lame” contour mode RoHS compliant

Enclosure drawing
Environmental conditions
Test
IEC 60068
Part ...
Visual inspection,
dimensions
Sealing tests
2-17
IEC 61178-1
clause ...
4.5
4.6
4.8.2
Solderability
2-20
4.8.3
Resistance to
soldering heat
Shock
2-27
4.8.8
Bump
2-29
4.8.6
Free fall
2-32
4.8.9
Vibration, sinusoidal 2-6
4.8.7
Rapid change of
2-14
temperature
Dry heat
2-2
4.8.5
4.8.11
Damp heat, cyclic 2-30
Cold
2-1
4.8.12
4.8.13
Climatic sequence 1-7
Damp heat, steady 2-3
state
Endurance tests
- ageing
- extended aging
4.8.14
4.8.15
4.9.1
4.9.2
Test conditions
Enclosure styles as in IEC
60122-3, if applicable
Gross leak: Test Qc,
Fine leak: Test Qk
Test Ta (235 ± 5)°C Method 1
Test Tb Method 1A, 5s
Test Ea, 3 x per axes 100g, 6 ms
half-sine pulse
Test Eb, 4000 bumps per Axes,
40g, 6 ms
Test Ed procedure 1,
2 drops from 1m height
Test Fc, 30 min per axes,
10 Hz - 55 Hz 0,75mm; 55 Hz -
1 kHz, 10g
Test Na, 10 cycles at extremes of
operating temperature range
Test Ba, 16 h at upper
temperature indicated by
climatic category
Test Db variant 1 severity b),
55°C/95% r.H., 6 cycles
Test Aa, 2 h at lower
temperature indicated by
climatic category
Sequence of 4.8.11, 4.8.12 (1^st
cycle), 4.8.13, 4.8.12 (5 cycles)
Test Ca, 56 days
30 days @ 85°C
1000h, 2000h, 8000h @85°C
GmbH & Co. KG
Wasemweg 5
D-74821 Mosbach
Germany
AXX3225L
page 2(2)
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