AXE1200 Datasheet, PDF (1/2 Pages) Advanced XTAL Products – Crystal Oscillator (PXO) 1200 MHz

Specification AXE1200
Issue: 04 Date: 2008-01-25
Oscillator type : Crystal Oscillator (PXO) 1200 MHz
Parameter
min. typ. max. Unit Condition
Nominal frequency
Frequency stability
Initial tolerance
vs. temperature
in operating temperature range
operating temperature range
vs. supply voltage variation
vs. load change
long term (aging) 1^st year
long term (aging) following years
Frequency adjustment range
Mechanical (internal trimmer)
RF output
Signal waveform
Load
Amplitude
Phase noise
Start-up time
Supply voltage V_S
Current consumption (steady state @ +25°C)
Operable temperature range
Storage temperature range
1 200
MHz
ppm
±1 ppm
±50 ppm
@25°C
Steady state
-30
+85 °C
±0.2 ppm V_S ±5%
±0.1 ppm Load ±5%
±2 ppm @ +25°C
±1 ppm/y per year @ +25°C
N.A.
ppm N.A.
Sine wave
50
+7
-140 -135
-142 -140
-145
10
14.25 15 15.75
50
-40
+90
-55
+105
Ω
dBm
dBc/Hz
dBc/Hz
dBc/Hz
ms
V
mA
°C
°C
±10 %
@ 10 kHz
@ 100 kHz
@ 1 MHz
@25°C
Enclosure (see drawing) (LxWxH)
54 x 40 x 20
mm
Weight
60 gram
Packing
bulk
ESD Sensitivity
1500
V
HBM as in IEC 61000-4-2
Notes:
1. Terminology and test conditions are according to IEC standard IEC60679-1, unless otherwise stated
Ordering Code:
Model (Specification) Frequency [MHz]
AXE1200
1200
GmbH & Co. KG
Wasemweg 5
D-74821 Mosbach
Germany
AXE1200
page 1(2)
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