HCPL-3100-300E Datasheet, PDF (4/14 Pages) AVAGO TECHNOLOGIES LIMITED – Power MOSFET/IGBT Gate Drive Optocouplers

Demonstrated ESD
Performance
Human Body Model: MIL-STD-
883 Method 3015.7: Class 2
Machine Model: EIAJ IC-121-
1988 (1988.3.28 Version 2),
Test Method 20, Condition
C: 1200 V
Regulatory Information
The HCPL-3100/3101 has been
approved by the following
organization:
UL
Recognized under UL 1577,
Component Recognition
Program, File E55361.
Insulation and Safety Related Specifications
Parameter
Min. External Air Gap
(External Clearance)
Min. External Tracking
Path (External
Creepage)
Min. Internal Plastic
Gap (Internal
Clearance)
Symbol
L(IO1)
L(IO2)
Value Units
6.0 mm
6.0 mm
Conditions
Shortest distance measured through air, between two
conductive leads, input to output
Shortest distance path measured along outside surface
of optocoupler body between input and output leads
0.15 mm Through insulation distance conductor to conductor
inside the optocoupler cavity
Absolute Maximum Ratings
Parameter
Storage Temperature
Operating Temperature
Symbol
T_S
T_A
Input
Continuous
I_F
Current
Reverse
V_R
Voltage
Supply Voltage V_CC
Output 1 Continuous
I_O1
Current
Peak Current
Voltage
V_O1
Output 2 Continuous
I_O2
Current
Peak Current
Output Power Dissipation
P_O
Total Power Dissipation
P_T
Lead Solder Temperature
Device
HCPL-3100
HCPL-3101
HCPL-3100
HCPL-3101
HCPL-3100
HCPL-3101
Min. Max. Unit
Conditions
-55 125 °C
-40 100 °C
-40 85
25 mA
20 mA
6
V T_A = 25°C
5
35
V
0.1 A
0.6 A Pulse Width < 0.15 µs,
Duty cycle = 1%
35 V
0.1 A
0.6 A Pulse Width < 0.15 µs,
Duty cycle = 1%
500 mW
550 mW
270°C for 10 s, 1.0 mm below seating plane
Fig. Note
11
1
11
1
1
1
1
1
12
1
12
1
4