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AT-41500 Datasheet, PDF (2/5 Pages) AVAGO TECHNOLOGIES LIMITED – Up to 6 GHz Low Noise Silicon Bipolar Transistor Chip
Table 1. Absolute Maximum Ratings [1]
Symbol
VEBO
VCBO
VCEO
IC
PT
TJ
TSTG
qjc
Parameter
Emitter-Base Voltage
Collector-Base Voltage
Collector-Emitter Voltage
Collector Current
Power Dissipation[2, 3]
Junction Temperature
Storage Temperature
Thermal Resistance [2, 4]
Unit
V
V
V
mA
mW
°C
°C
°C/W
Max Rating
1.5
20
12
60
500
200
-60 to 200
95
Notes:
1. Operation in excess of any one of these conditions may result in permanent damage to the device.
2. T—MOUNTING SURFACE = 25 °C
3. Derate at 10.5 mW/°C for T—MOUNTING SURFACE > 153 °C.
4. The small spot size of this technique results in a higher, though more accurate determination of θjc than do the alternate method.
Table 2. Electrical Specifications at TA = +25°C, VCE=8V
Symbol Parameter and Test Condition
NFo
Optimum Noise Figure: Ic = 10 mA
Units Min.
Typ.
Max.
f = 1.0 GHz dB
1.40
f = 2.0 GHz dB
1.70
f = 4.0 GHz dB
3.00
GA
Gain @ NFo ; Ic=10mA
f = 1.0 GHz dB
17.0
f = 2.0 GHz dB
12.5
f = 4.0 GHz dB
8.0
|S21E|2 Insertion Power Gain : Ic = 25 mA
f = 1.0 GHz dB
17.0
f = 2.0 GHz dB
11.0
P1dB Power Output @1dB Gain Compression:Ic=25 mA
f = 2.0 GHz dBm
18.0
G1dB 1 dB Compressed Gain: Ic = 25 mA
f = 2.0 GHz dB
13.0
fT
Gain Bandwidth Product: Ic = 25 mA
GHz
8.0
hFE
Forward Current Transfer Ratio: Ic = 10 mA
30
150
270
ICBO
Collector Cutoff Current: VCB = 8 V
uA
0.2
IEBO
Emitter Cutoff Current: VEB = 1 V
uA
1
Notes:
1. RF performance is determined by packaging and testing 10 devices per wafer.
2. RF performance is measured in 86 plastic packages.