ACPL-5160 Datasheet, PDF (1/33 Pages) AVAGO TECHNOLOGIES LIMITED – 2.5 Amp Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and Fault Status Feedback

ACPL-5160, ACPL-5161 and 5962-12236*
2.5 Amp Gate Drive Optocoupler with Integrated (V_CE)
Desaturation Detection and Fault Status Feedback
Data Sheet
Description
This family of Avago 2.5 Amp Gate Drive Optocouplers
provides Integrated Desaturation (V_CE) Detection and Fault
Status Feedback for IGBT V_CE fault protection in a rugged,
hermetically-sealed package. The devices are capable of
operation and storage over the full military temperature
range and can be purchased as either commercial-grade
products or in fully MIL-STD compliant versions. The
military standard devices are manufactured and tested
on a MIL-PRF-38534 certified line to Class H specifications;
Standard Microcircuit Drawing (SMD) 5962-12236. They
are included in the Defense Logistics Agency (DLA) Land
and Maritime Qualified Manufacturers List, QML-38534
for Hybrid Microcircuits.
Fault Protected IGBT Gate Drive
+HV
ISOLATION
BOUNDARY
ACPL - 516x
Features
• 2.5 A maximum peak output current
• Drive IGBTs up to I_C = 150 A, V_CE = 1200 V
• Optically isolated, FAULT status feedback
• Hermetically sealed ceramic package
• CMOS/TTL compatible
• 500 ns max. switching speeds
• “Soft” IGBT turn-off
• Integrated fail-safe IGBT protection
– Desat (V_CE) detection
­– Under Voltage Lock-Out protection (UVLO) with
hysteresis
• User configurable: inverting, noninverting, auto-reset,
auto-shutdown
• Wide operating V_CC range: 15 V to 30 V
• –55 °C to +125 °C operating temperature range
• 15 kV/µs Typical Common Mode Rejection (CMR) at
V_CM = 1000 V
ISOLATION
BOUNDARY
ACPL - 516x
ISOLATION
BOUNDARY
ACPL - 516x
3-PHASE
M
INPUT
ACPL - 516x
ISOLATION
BOUNDARY
–HV
ACPL - 516x
ISOLATION
BOUNDARY
ACPL - 516x
ISOLATION
BOUNDARY
FAULT
MICROCONTROLLER
ACPL - 516x
ISOLATION
BOUNDARY
* SMD pending
CAUTION: It is advised that normal static precautions be taken in handling and assembly
of this component to prevent damage and/or degradation which may be induced by ESD.