AT90CAN128_14 Datasheet, PDF (86/428 Pages) ATMEL Corporation – Non volatile Program and Data Memories

TDI, JTAG Test Data In. Serial input data to be shifted in to the Instruction Register or Data Reg-
ister (scan chains). When the JTAG interface is enabled, this pin can not be used as an I/O pin.
• TCK, ADC6 – Port F, Bit 6
ADC6, Analog to Digital Converter, input channel 6.
TDO, JTAG Test Data Out. Serial output data from Instruction Register or Data Register. When
the JTAG interface is enabled, this pin can not be used as an I/O pin.
• TMS, ADC5 – Port F, Bit 5
ADC5, Analog to Digital Converter, input channel 5.
TMS, JTAG Test mode Select. This pin is used for navigating through the TAP-controller state
machine. When the JTAG interface is enabled, this pin can not be used as an I/O pin.
• TDO, ADC4 – Port F, Bit 4
ADC4, Analog to Digital Converter, input channel 4.
TCK, JTAG Test Clock. JTAG operation is synchronous to TCK. When the JTAG interface is
enabled, this pin can not be used as an I/O pin.
• ADC3 – Port F, Bit 3
ADC3, Analog to Digital Converter, input channel 3.
• ADC2 – Port F, Bit 2
ADC2, Analog to Digital Converter, input channel 2.
• ADC1 – Port F, Bit 1
ADC1, Analog to Digital Converter, input channel 1.
• ADC0 – Port F, Bit 0
ADC0, Analog to Digital Converter, input channel 0.
86 AT90CAN32/64/128
7679H–CAN–08/08