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E1466D Datasheet, PDF (4/8 Pages) ATMEL Corporation – 32 KHZ CLOCK CMOS IC WITH DIGITAL TRIMMING
Test Functions
For test purposes, the TEST pad is open. With a high resistance probe (R ³ 10 MW,
C ³ 20 pF), a test frequency fTEST of 128 Hz can be measured at the TEST pad. Connecting
TEST (for at least 32 ms) to VDD changes the motor period from the selected value to TMT
(mask-selectable) while the pulse width remains unaffected. This feature can be used for test-
ing the mechanical parts of the clock.
Absolute Maximum Ratings
Absolute maximum ratings define parameter limits which, if exceeded, may permanently change or damage the device.
All inputs and outputs on Atmel’s circuits are protected against electrostatic discharges. However, precautions to minimize
the build-up of electrostatic charges during handling are recommended.
The circuit is protected against supply voltage reversal for typically 5 minutes.
Parameters
Symbol
Value
Unit
Supply voltage
Input voltage range, all inputs
Output short-circuit duration
VSS
-0.3 to 5 V
V
VIN
(VSS - 0.3 V) £ VIN £ (VDD + 0.3 V)
V
indefinite
Power dissipation (DIL package)
Ptot
Operating ambient temperature range
Tamb
Storage temperature range
Tstg
Lead temperature during soldering at 2 mm distance, 10 s
Tsld
125
mW
-20 to +70
°C
-40 to +125
°C
260
°C
4 e1466D
4731A–CLOCK–06/03