ATR2740 Datasheet, PDF (3/7 Pages) ATMEL Corporation – DAB DIGITAL PROCESSING DEVICE

Figure 1. Block Diagram
VINP
VINN
VCM
XO
CAN
USB
IRQ0
IRQ1
IRQ2
Watchdog
Databus
Adressbus
Control
ATR2740 [Preliminary]
ATR2740
ADC
ADC_DAT A
Clock
Generation
Adv anced
Power
Management
DAB
Channel Decoder
Signal
Processing
CORE
ARM7TDMISy stem
T X RDI
SFCO
I2S/SPDIF
I2S/SPDIF
Watchdog
SSO
SPI
USART1
USART2
RESET
GPIO
JTAG
Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Parameters
Symbol
Min.
Max.
Unit
Operating free air temperature range for LQFP128
-40
+85
°C
Operating free air temperature range for BGA121
-10
+70
°C
Storage temperature
T_Stg
-60
+150
°C
VDD18
-0.3
+1.95
V
DC supply voltage
VDD33
-0.3
+3.6
V
AVDD
-0.3
+3.6
V
DC input voltage
-0.3
+1.95
V
Notes: 1. The part may not survive if all maximums are applied simultaneously.
DC Electrical Characteristics
Test conditions (if not otherwise specified): V_CC = +1.8 V, T_amb = +25° C
No. Parameters
Test Conditions
Pin Symbol Min.
Typ.
Max.
Unit
1.1 DC supply voltage
VDD18
1.65
1.8
1.95
V
1.2
Low-level input
voltage
VDD18 = 1.65 to 1.95 V
V_IL
-0.3
+0.3 ×
VDD18
V
1.3
High-level input
voltage
VDD18 = 1.65 to 1.95 V
V_IH
+0.7 ×
VDD18
VDD18
+ 0.3
V
1.4
Low-level output
voltage
I_OL = 0.3 mA
VDD18 = 1.65 V
V_OL
0.1
V
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
Type*
3
4816BS–DAB–11/04