TS80C31X2_08 Datasheet, PDF (28/42 Pages) ATMEL Corporation – 8-bit CMOS Microcontroller ROMless

V_IH = V_CC - 0.5V; XTAL2 N.C.; EA = RST = Port 0 = V_CC. I_CC would be slightly higher if a crystal
oscillator used..
2. Idle I_CC is measured with all output pins disconnected; XTAL1 driven with T_CLCH, T_CHCL = 5 ns,
V_IL = V_SS + 0.5 V, V_IH = V_CC - 0.5 V; XTAL2 N.C; Port 0 = V_CC; EA = RST = V_SS (see Figure 14-
3.).
3. Power Down I_CC is measured with all output pins disconnected; EA = V_SS, PORT 0 = V_CC;
XTAL2 NC.; RST = V_SS (see Figure 14-4.).
4. Capacitance loading on Ports 0 and 2 may cause spurious noise pulses to be superimposed
on the V_OLs of ALE and Ports 1 and 3. The noise is due to external bus capacitance discharg-
ing into the Port 0 and Port 2 pins when these pins make 1 to 0 transitions during bus
operation. In the worst cases (capacitive loading 100pF), the noise pulse on the ALE line may
exceed 0.45V with maxi V_OL peak 0.6V. A Schmitt Trigger use is not necessary.
5. Typicals are based on a limited number of samples and are not guaranteed. The values listed
are at room temperature and 5V.
6. Under steady state (non-transient) conditions, I_OL must be externally limited as follows:
Maximum I_OL per port pin: 10 mA
Maximum I_OL per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total I_OL for all output pins: 71 mA
If I_OL exceeds the test condition, V_OL may exceed the related specification. Pins are not guar-
anteed to sink current greater than the listed test conditions.
7. For other values, please contact your sales office.
8. Operating I_CC is measured with all output pins disconnected; XTAL1 driven with T_CLCH, T_CHCL =
5 ns (see Figure 14-5.), V_IL = V_SS + 0.5 V,
V_IH = V_CC - 0.5V; XTAL2 N.C.; EA = Port 0 = V_CC; RST = V_SS. The internal ROM runs the code
80 FE (label: SJMP label). I_CC would be slightly higher if a crystal oscillator is used. Measure-
ments are made with OTP products when possible, which is the worst case.
V_CC
I_CC
V_CC
V_CC
P0
V_CC
RST EA
(NC)
CLOCK
SIGNAL
XTAL2
XTAL1
V_SS
Figure 14-1. I_CC Test Condition, under reset
All other pins are disconnected.
28 AT/TS80C31X2
4428E–8051–02/08