MH1RT Datasheet, PDF (16/22 Pages) ATMEL Corporation – Radiation Tolerant 0.35 um CMOS

MH1RT QualPack
4.6.2 Results
All the parts passed the functional test even after 500krads irradiation provided the power supply
can deliver the requested current (range 2A)
A . ICCSB (in mA on the graphs) : It is the most sensitive parameter . The measurement is done
following three conditions:
ICCSB00 the registers are loaded with 0
ICCSB10 the registers are loaded with a queue 01010…
ICCSB11 the registers are loaded with 1.
It has to be noticed that where the parts were irradiated with registers to 0 ICCSB00 is 0
All the other configuration exhibit a large increase of ICCSB higher than 1amp (The 3 first
measurements were clamped to 250mA);
The 3 weeks ambient annealing shows a slow but significant recovery of the parameter .
The 2 last additional weeks of annealing was in dynamic mode (clk active in low frequency) and thus the
recovery is fully achieved.
The additional half dose irradiation test confirms the previous behavior and the high temperature
annealing leads to an almost full recovery of the parameter.
B. Input leakages (in uA on the graphs),
Only IIL is affected on the parts at 400krads and 500krads . This is recovered after annealing.
C.Tpd (TP8 given as an example in ns), Input clamp voltages
No significant change can be observed even after 500krads irradiation.
D. Output voltages
These parameters drift slightly due to irradiation but remains inside the specifications limits.
The recovery is achieved after ambient bias annealing .
4.6.3 Irradiation summary
This test plan shows the high tolerance of the V29, MH1RT Test Vehicle to a total ionizing dose
irradiation with Cobalt 60 gamma ray up to 500krads following the MIL STD 883 method 1019.5.
The behavior noticed on the test vehicle during the qualification experiments can reasonably be
predicted on the whole MH1RT product family.
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Rev. 2 – Jan 2002