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AT28C010-12DK_05 Datasheet, PDF (1/18 Pages) ATMEL Corporation – Space 1-megabit (128K x 8) Paged Parallel EEPROMs
Features
• Fast Read Access Time – 120 ns
• Automatic Page Write Operation
– Internal Address and Data Latches for 128 Bytes
– Internal Control Timer
• Fast Write Cycle Time
– Page Write Cycle Time – 10 ms Maximum
– 1 to 128-byte Page Write Operation
• Low Power Dissipation
– 50 mA Active Current
– 10 mA CMOS Standby Current
• Hardware and Software Data Protection
• DATA Polling for End of Write Detection
• High Reliability CMOS Technology
– Endurance: 5.104 Read Cycles
– Data Retention: 10 Years
• Operating Range: 4.5V to 5.5V, -55 to +125°C
• CMOS and TTL Compatible Inputs and Outputs
• No Single Event Latch-up below a LET Threshold of 80 MeV/mg/cm2
• Tested up to a Total Dose of (according to MIL STD 883 Method 1019):
– 10 kRads (Si) Read-only Mode when Biased
– 30 kRads (Si) Read-only Mode when Unbiased
• JEDEC Approved byte-Wide Pinout
• 435 Mils Wide 32-Pin Flat Pack Package
AT28C010-12DK Mil
Space
1-megabit
(128K x 8)
Paged Parallel
EEPROMs
AT28C010-12DK
Description
The AT28C010-12DK is a high-performance Electrically Erasable and Programmable
Read-Only Memory. Its one megabit of memory is organized as 131,072 words by 8
bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device
offers access times to 120 ns with power dissipation of just 275 mW. When the device
is deselected, the CMOS standby current is less than 10 mA.
The AT28C010-12DK is accessed like a Static RAM for the read or write cycle without
the need for external components. The device contains a 128-byte page register to
allow writing of up to 128 bytes simultaneously. During a write cycle, the address and
1 to 128 bytes of data are internally latched, freeing the address and data bus for
other operations. Following the initiation of a write cycle, the device will automatically
write the latched data using an internal control timer. The end of a write cycle can be
detected by DATA POLLING of I/O7. Once the end of a write cycle has been detected
a new access for a read or write can begin.
Atmel's 28C010 has additional features to ensure high quality in manufacturing. The
device utilizes internal error correction for extended endurance and improved data
retention characteristics. An optional software data protection mechanism is available
to guard against inadvertent writes. The device also includes an extra 128 bytes of
EEPROM for device identification or tracking.
Rev. 4259C–AERO–05/05
1