AT-89C52 Datasheet, PDF (1/11 Pages) ATMEL Corporation – 125°C DYNAMIC OPERATING LIFE TEST

PAGE 1 OF 11
ATMEL CORPORATION
Tel: [phone]
Fax: [phone]
AT-89C52 CMOS FLASH MICRO CONTROLLER RELIABILITY DATA*
- 125°C DYNAMIC OPERATING LIFE TEST
- 200°C RETENTION BAKE
- 125°C DYNAMIC OPERATING LIFE TEST (PLASTIC)
- 125°C RETENTION BAKE (PLASTIC)
- 15 PSIG PRESSURE POT
- 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST
- EXTENDED TEMPERATURE CYCLING
- EXTENDED THERMAL SHOCK
- 131°C/85% RELATIVE HUMIDITY HAST TEST
*This report was generated from AT-89C52 reliability testing.
This data is applicable to the following device types due to same
technology grouping as defined on MIL-M-38535 Appendix A:
AT-89C51
OCTOBER 2006
2325 Orchard Parkway San Jose CA. 95131