SA51M Datasheet, PDF (1/1 Pages) Cirrus Logic – TABLE 4 GROUP A INSPECTION

MICROTECHNOLOGY
TABLE 4 GROUP A INSPECTION
SA51M
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SG PARAMETER
SYMBOL TEMP. POWER TEST CONDITIONS
MIN MAX UNITS
1 Quiescent Current
1 ON Voltage
1 OFF Leakage
1 Input Voltage Threshold
I_Q
25°C +28Vdc PWM Not switching
18
mA
V_DS
25°C +28Vdc I_D = 5A
1.8
V
I_DSS
25°C +70Vdc Output off, V_DS = 70V
25
µA
V_INTH
25°C +28Vdc Input increased until A_OUT and B_OUT change 0.8
2.7
V
state
3 Quiescent Current
3 ON Voltage
3 OFF Leakage
3 Input Voltage Threshold
I_Q
–55°C +28Vdc PWM Not switching
18
mA
V_DS
–55°C +28Vdc I_D = 5A
1.2
V
I_DSS
–55°C +70Vdc Output off, V_DS = 70V
25
µA
V_INTH
–55°C +28Vdc Input increased until A_OUT and B_OUT change 0.8
2.7
V
state
2 Quiescent Current
2 ON Voltage
2 OFF Leakage
2 Input Voltage Threshold
I_Q
125°C +28Vdc PWM Not switching
18
mA
V_DS
125°C +28Vdc I_D = 5A
2.4
V
I_DSS
125°C +70Vdc Output OFF, V_DS = 70V
250
µA
V_INTH
125°C +28Vdc Input increased until A_OUT and B_OUT change 0.8
2.7
V
state
4 Operating Supply Current
7 Disable Function
I_S
25°C +28Vdc PWM = 500khz TTL
D_IS
25°C +28Vdc Disable > 3.6V, PWM input=500KHz,
verify no switching
60
mA
Pass/Fail
1/V_CC=+12Vdc, R_SENSE = Disable = Ground, R_L = 1K ohm, A_OUT to B_OUT
BURN IN CIRCUIT
R2
1
8
+28V
C2
7
2 _DUT
+12V
3
6
C3
4
5
DEVICE CELL
OUTPUT
DEVICE CELL
INPUT
–12V
1
2
NE555
–12V +12V
R1
R3
3
C4 C5
4
C1
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SA51MU REV. A JANUARY 1998 © 1998 Apex Microtechnology Corp.