APM4500 Datasheet, PDF (12/13 Pages) Anpec Electronics Coropration – Dual Enhancement Mode MOSFET (N-and P-Channel)

APM4500
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
MIL-STD-883D-2003
MIL-STD 883D-1005.7
JESD-22-B, A102
MIL-STD 883D-1011.9
Carrier Tape & Reel Dimensions
E
Po
P
D
P1
F
W
Description
245°C,5 SEC
1000 Hrs Bias @ 125°C
168 Hrs, 100% RH, 121°C
-65°C ~ 150°C, 200 Cycles
t
Bo
Ao
D1
Ko
T2
J
C
A
B
T1
Application
SOP- 8
A
330 ± 1
F
5.5± 1
B
62 +1.5
D
C
12.75+
0.15
D1
J
2 ± 0.5
Po
T1
12.4 ± 0.2
P1
T2
2 ± 0.2
Ao
W
12± 0. 3
Bo
1.55 +0.1 1.55+ 0.25 4.0 ± 0.1 2.0 ± 0.1 6.4 ± 0.1 5.2± 0. 1
P
E
8± 0.1 1.75±0.1
Ko
t
2.1± 0.1 0.3±0.013
Copyright  ANPEC Electronics Corp.
12
Rev. A.2 - May., 2003
www.anpec.com.tw