AM27C128 Datasheet, PDF (9/12 Pages) Advanced Micro Devices – 112dB 192kHz 24-BIT SCH DAC

TEST CONDITIONS
5.0 V
Device
Under
Test
C_L
6.2 kΩ
2.7 kΩ
Note:
Diodes are IN3064 or equivalents.
Figure 3. Test Setup
11420E-7
SWITCHING TEST WAVEFORM
3V
1.5 V
0V
Input
Test Points
1.5 V
Output
Table 1. Test Specifications
Test Condition
-45, -55, All
-70
others Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
≤ 20
ns
Input Pulse Levels
0.0–3.0 0.45–2.4 V
Input timing measurement
reference levels
1.5 0.8, 2.0 V
Output timing measurement
reference levels
1.5 0.8, 2.0 V
2.4 V
0.45 V
2.0 V
2.0 V
Test Points
0.8 V
0.8 V
Input
Output
Note: For C_L = 30 pF.
Note: For C_L = 100 pF.
KEY TO SWITCHING WAVEFORMS
11420E-8
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
KS000010-PAL
Am27C128
9