AM29DS163D Datasheet, PDF (35/50 Pages) Advanced Micro Devices – 16 Megabit CMOS 1.8 Volt-only, Simultaneous Operation Flash Memory

ADVANCE INFORMATION
TEST CONDITIONS
Device
Under
Test
C_L
Note: Diodes are IN3064 or equivalent
Figure 11. Test Setup
Table 16. Test Specifications
Test Condition
100, 120
Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–2.0 V
V
Input timing measurement
reference levels
1.0
V
Output timing measurement
reference levels
1.0
V
Key To Switching Waveforms
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
2.0 V
0.0 V
Input
1.0 V
Measurement Level
1.0 V
Figure 12. Input Waveforms and Measurement Levels
Output
Am29DS163D
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