AM29F016D_06 Datasheet, PDF (28/43 Pages) Advanced Micro Devices – 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory

DATA SHEET
TEST CONDITIONS
5.0 V
Device
Under
Test
C_L
6.2 kΩ
2.7 kΩ
Note: Diodes are IN3064 or equivalent
Figure 8. Test Setup
Table 11. Test Specifications
Test Condition
All speed
options Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
100
pF
Input Rise and Fall Times
20
ns
Input Pulse Levels
0.45–2.4
V
Input timing measurement
reference levels
0.8
V
Output timing measurement
reference levels
2.0
V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
KS000010-PAL
26
Am29F016D
21444E6 November 1, 2006