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AM29BL802C Datasheet, PDF (28/46 Pages) SPANSION – 8 Megabit (512 K x 16-Bit) CMOS 3.0 Volt-only Burst Mode Flash Memory
DATA SHEET
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
ILI
Input Load Current
VIN = VSS to 5.5 V,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
ILO
Output Leakage Current
VOUT = VSS to 5.5 V,
VCC = VCC max
ICC1
VCC Active Read Current
(Notes 1, 2)
CE# = VIL, OE# = VIH, 5 MHz
9
ICC2
VCC Active Write Current
(Notes 2, 3, 6)
CE# = VIL, OE# = VIH
20
ICC3
VCC Standby Current (Note 2) CE#, RESET# = VCC±0.3 V
3
ICC4
VCC Standby Current During
Reset (Note 2)
RESET# = VSS ± 0.3 V
3
ICC5
Automatic Sleep Mode
(Notes 2, 4)
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
OE# = VIH
OE# = VIL
3
8
25 MHz
15
ICC6
VCC Burst Mode Read Current CE# = VIL,
(Notes 2, 5)
OE# = VIH
33 MHz
20
40 MHz
25
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.3 V
–0.5
0.7 x VCC
11.5
VOL
VOH1
VOH2
VLKO
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
Output High Voltage
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
Low VCC Lock-Out Voltage (Note
4)
0.85 x VCC
VCC–0.4
2.3
Max
Unit
±1.0
µA
35
µA
±1.0
µA
16
mA
30
mA
10
µA
10
µA
10
µA
20
µA
30
mA
35
mA
40
mA
0.8
V
5.5
V
12.5
V
0.45
V
V
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode
current is 3 µA.
5. 32-word average.
6. Not 100% tested.
26
Am29BL802C
22371C7 November 3, 2006