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AM29LV200B_06 Datasheet, PDF (27/46 Pages) Advanced Micro Devices – 2 Megabit (256 K x 8-Bit/128 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory
DATA SHEET
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH,
5 MHz
7
ICC1
VCC Active Read Current
(Notes 1, 2)
Byte Mode
CE# = VIL, OE# = VIH,
1 MHz
5 MHz
2
7
Word Mode
1 MHz
2
ICC2
VCC Active Write Current
(Notes 2, 3, and 5)
CE# = VIL, OE# = VIH
15
ICC3
VCC Standby Current (Note 2) CE#, RESET# = VCC±0.3 V
ICC4
VCC Reset Current (Note 2)
RESET# = VSS ± 0.3 V
ICC5
Automatic Sleep Mode (Notes 2, VIH = VCC ± 0.3 V;
4)
VIL = VSS ± 0.3 V
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.3 V
0.2
0.2
0.2
–0.5
0.7 x VCC
11.5
VOL
VOH1
VOH2
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-Out Voltage
(Note 5)
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
0.85 VCC
VCC–0.4
2.3
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
5. Not 100% tested.
Max
Unit
±1.0
µA
35
µA
±1.0
µA
12
4
mA
12
4
30
mA
5
µA
5
µA
5
µA
0.8
V
VCC + 0.3 V
12.5
V
0.45
V
V
2.5
V
October 10, 2006 21521D6
Am29LV200B
25