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AM29SL800D Datasheet, PDF (26/46 Pages) Advanced Micro Devices – 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory
ADVANCE INFORMATION
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 11.0 V
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH,
5 MHz
5
ICC1
VCC Active Read Current
(Notes 1, 2)
Byte Mode
CE# = VIL, OE# = VIH,
1 MHz
5 MHz
1
5
Word Mode
1 MHz
1
ICC2
VCC Active Write Current
(Notes 2, 3, 5)
CE# = VIL, OE# = VIH
15
ICC3
VCC Standby Current (Note 2) CE#, RESET# = VCC ± 0.2 V
ICC4
VCC Reset Current (Note 2)
RESET# = VSS ± 0.2 V
ICC5
Automatic Sleep Mode
(Notes 2, 3)
VIH = VCC ± 0.2 V;
VIL = VSS ± 0.2 V
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 2.0 V
0.2
0.2
0.2
–0.5
0.7 x VCC
9.0
VOL1
VOL2
VOH1
VOH2
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-Out Voltage
(Note 4)
IOL = 2.0 mA, VCC = VCC min
IOL = 100 µA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
0.85 x VCC
VCC–0.1
1.2
Notes:
1. The ICC current listed is typically less than 1 mA/MHz, with OE# at VIH. Typical VCC is 2.0 V.
2. The maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 50 ns.
5. Not 100% tested.
Max
±1.0
35
±1.0
10
3
10
3
30
5
5
5
0.3 x VCC
VCC + 0.3
11.0
0.25
0.1
1.5
Unit
µA
µA
µA
mA
mA
µA
µA
µA
V
V
V
V
V
V
V
V
March 17, 2003
Am29SL800D
25