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AM29F002B_06 Datasheet, PDF (26/42 Pages) Advanced Micro Devices – 2 Megabit (256 K x 8-Bit) CMOS 5.0 Volt-only Boot Sector Flash Memory
DATA SHEET
TEST CONDITIONS
5.0 V
Device
Under
Test
CL
6.2 kΩ
2.7 kΩ
Note: Diodes are IN3064 or equivalent
Figure 8. Test Setup
Table 7. Test Specifications
Test Condition
All
-55
others Unit
Output Load
1 TTL gate
Output Load Capacitance, CL
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
20
ns
Input Pulse Levels
0.0–3.0 0.45–2.4 V
Input timing measurement
reference levels
1.5 0.8, 2.0 V
Output timing measurement
reference levels
1.5 0.8, 2.0 V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
24
Am29F002B/Am29F002NB
21527D5 November 1, 2006