AM28F512A Datasheet, PDF (24/34 Pages) Advanced Micro Devices – 512 Kilobit (64 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms

SWITCHING TEST WAVEFORMS
2.4 V
0.45 V
2.0 V
2.0 V
Test Points
0.8 V
0.8 V
Input
Output
3V
1.5 V
0V
Input
Test Points
1.5 V
Output
AC Testing (all speed options except -70): Inputs are driven
at 2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse
rise and fall times are ≤10 ns.
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are ≤10 ns.
18880C-17
SWITCHING CHARACTERISTICS over operating range unless otherwise specified
AC Characteristics—Read Only Operation
Parameter Symbols
JEDEC
Standard
Parameter Description
t_AVAV
t_ELQV
t_AVQV
t_GLQV
t_ELQX
t_RC
t_CE
t_ACC
t_OE
t_LZ
Read Cycle Time (Note 2)
Chip Enable Access Time
Address Access Time
Output Enable Access Time
Chip Enable to Output in Low Z
(Note 2)
t_EHQZ
t_DF
Chip Disable to Output in High Z
(Note 1)
t_GLQX
t_OLZ
Output Enable to Output in Low Z
(Note 2)
t_GHQZ
t_DF
Output Disable to Output in
High Z (Note 2)
t_AXQX
t_OH
Output Hold from first of Address,
CE#, or OE# Change (Note 2)
t_VCS
V_CC Setup Time to Valid Read
(Note 2)
Min
Max
Max
Max
Min
Max
Min
Max
Min
Min
Am28F512A Speed Options
-70 -90 -120 -150 -200
70
90 120 150 200
70
90 120 150 200
70
90 120 150 200
35
35
50
55
55
0
0
0
0
0
20
20
30
35
35
0
0
0
0
0
20
20
30
35
35
0
0
0
0
0
50
50
50
50
50
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
Notes:
1. Guaranteed by design not tested.
2. Not 100% tested.
Am28F512A
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