AM28F010A Datasheet, PDF (23/35 Pages) Advanced Micro Devices – 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms

25
20
15
10
55°C
0°C
25°C
5
70°C
125°C
0
0
1
2
3
4
5
6
7
8
9
10
11
12
Frequency in MHz
Figure 7. Am28F010A—Average I_CC Active vs. Frequency
V_CC = 5.5 V, Addressing Pattern = Minmax
Data Pattern = Checkerboard
16778D-15
TEST CONDITIONS
5.0 V
Device
Under
Test
C_L
6.2 kΩ
2.7 kΩ
Note: Diodes are IN3064 or equivalent
Figure 8. Test Setup
16778D-16
Table 6. Test Specifications
Test Condition
-70 All others Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
≤10
ns
Input Pulse Levels
0.0–3.0 0.45–2.4 V
Input timing measurement
reference levels
1.5 0.8, 2.0 V
Output timing measurement
reference levels
1.5
0.8, 2.0 V
Am28F010A
23