EPF10K10ATI144-3 Datasheet, PDF (44/128 Pages) Altera Corporation – Embedded Programmable Logic Device Family

FLEX 10K Embedded Programmable Logic Device Family Data Sheet
Generic Testing
Each FLEX 10K device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100% yield.
AC test measurements for FLEX 10K devices are made under conditions
equivalent to those shown in Figure 19. Multiple test patterns can be used
to configure devices during all stages of the production flow.
Figure 19. FLEX 10K AC Test Conditions
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests must
not be performed under AC conditions.
Large-amplitude, fast-ground-current
transients normally occur as the device
outputs discharge the load capacitances.
When these transients flow through the
parasitic inductance between the device
ground pin and the test system ground,
significant reductions in observable noise
immunity can result. Numbers without
parentheses are for 5.0-V devices or outputs.
Numbers in parentheses are for 3.3-V devices
or outputs. Numbers in brackets are for
2.5-V devices or outputs.
464 Ω
(703 Ω)
[521 Ω]
Device
Output
250 Ω
(8.06 kΩ)
[481 Ω]
Device input
rise and fall
times < 3 ns
VCC
To Test
System
C1 (includes
JIG capacitance)
Operating
Conditions
Tables 17 through 21 provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 5.0-V FLEX 10K devices.
Table 17. FLEX 10K 5.0-V Device Absolute Maximum Ratings Note (1)
Symbol
Parameter
V _CC
V_I
I _OUT
T _STG
T _AMB
T_J
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Conditions
With respect to ground (2)
No bias
Under bias
Ceramic packages, under bias
PQFP, TQFP, RQFP, and BGA
packages, under bias
Min
Max Unit
–2.0
7.0
V
–2.0
7.0
V
–25
25
mA
–65
150 ° C
–65
135 ° C
150 ° C
135 ° C
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