EP1K10TC144-2N Datasheet, PDF (2/86 Pages) Altera Corporation – Programmable Logic Device Family

ACEX 1K Programmable Logic Device Family Data Sheet
...and More
Features
– -1 speed grade devices are compliant with PCI Local Bus
Specification, Revision 2.2 for 5.0-V operation
– Built-in Joint Test Action Group (JTAG) boundary-scan test
(BST) circuitry compliant with IEEE Std. 1149.1-1990, available
without consuming additional device logic.
– Operate with a 2.5-V internal supply voltage
– In-circuit reconfigurability (ICR) via external configuration
devices, intelligent controller, or JTAG port
– ClockLock^TM and ClockBoost^TM options for reduced clock delay,
clock skew, and clock multiplication
– Built-in, low-skew clock distribution trees
– 100% functional testing of all devices; test vectors or scan chains
are not required
– Pull-up on I/O pins before and during configuration
■ Flexible interconnect
– FastTrack^® Interconnect continuous routing structure for fast,
predictable interconnect delays
– Dedicated carry chain that implements arithmetic functions such
as fast adders, counters, and comparators (automatically used by
software tools and megafunctions)
– Dedicated cascade chain that implements high-speed,
high-fan-in logic functions (automatically used by software tools
and megafunctions)
– Tri-state emulation that implements internal tri-state buses
– Up to six global clock signals and four global clear signals
■ Powerful I/O pins
– Individual tri-state output enable control for each pin
– Open-drain option on each I/O pin
– Programmable output slew-rate control to reduce switching
noise
– Clamp to V_CCIO user-selectable on a pin-by-pin basis
– Supports hot-socketing
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Altera Corporation